Flicker, Stroboscopic Effect & Temporal Light Artefacts: IEEE 1789, EC CRM-005-2022 & Measurement Methods

📅 Published: 2026-05-15 · 🔄 Updated: 2026-05-15 · 📖 Scholarly Article

1. Introduction: Definition and Taxonomy of Temporal Light Artefacts

Temporal light artefacts (TLAs) are unwanted changes in visual perception caused by a light source whose luminance or spectral distribution fluctuates over time. The CIE, in its International Lighting Vocabulary (CIE S 017/E:2020) and technical report CIE 249:2022, distinguishes three categories of TLA: flicker (direct perception of luminance modulation at frequencies up to approximately 80 Hz in foveal vision), stroboscopic effect (apparent change in motion perception of moving objects under modulated light, visible at 80 Hz to approximately 2 kHz), and phantom array (spatial pattern of alternating bright and dark regions perceived during saccadic eye movements under modulated light, also known as the "ghost" effect). These artefacts are a well-documented source of visual discomfort, headache, and reduced task performance, and have attracted increasing regulatory attention in the European Union's EcoDesign framework.

2. Physiological Basis of TLA Perception

2.1 Temporal Contrast Sensitivity Function

Human temporal vision is characterized by a band-pass temporal contrast sensitivity function (TCSF), with peak sensitivity at approximately 10–15 Hz under photopic conditions and a high-frequency cutoff (critical flicker fusion frequency, CFF) typically at 50–60 Hz for full-field stimulation (de Lange, 1958; Kelly, 1971). The CFF is dependent on luminance level, retinal eccentricity, and stimulus size. Under typical indoor lighting (100–500 cd/m²), the CFF for direct flicker detection ranges from 55 Hz (central fovea, 1° field) to 90+ Hz (peripheral vision, 10°+ field). This peripheral sensitivity means that flicker that is invisible in central vision can still be perceived subconsciously in the periphery, triggering eye strain and headaches.

2.2 Stroboscopic Effect Visibility Measure (SVM)

The stroboscopic effect becomes detectable when high-frequency modulation (80 Hz to 2 kHz) interacts with the motion of objects in the visual field. The CIE developed the stroboscopic effect visibility measure (SVM, defined in CIE TN 006:2016 and adopted in IEC TR 63158:2018) as a unified metric. SVM is computed as:

SVM = [ Σm (Cm / Tm )a ]1/a

where Cm is the relative amplitude of the m-th Fourier component of the light waveform, Tm is the threshold amplitude for that frequency (based on the CIE TCSF), and a is the Minkowski summation exponent (a ≈ 3.7). An SVM value of 1.0 corresponds to the visibility threshold for 50% of observers. Values below 0.4 are generally considered imperceptible, 0.4–1.0 visible upon deliberate attention, and > 1.0 clearly visible. IEC TR 63158 specifies a standard measurement protocol using a photodiode-based detector capable of 20 kHz sampling or higher.

3. Regulatory Frameworks

3.1 IEEE 1789-2015: Recommended Practices for Modulating Current in High-Brightness LEDs

IEEE 1789-2015 provides risk-based categorization of LED light modulation:

Risk LevelFrequency RangePercent Flicker Limit (0–100 Hz)Percent Flicker Limit (100 Hz – 3 kHz)
No observable effect level (NOEL)Allf × 0.025%f × 0.08%
Low risk levelAllf × 0.08%f × 0.25%

Note: f is the fundamental frequency in Hz. "f × 0.025%" means that at 120 Hz, the maximum allowed percent flicker is 120 × 0.025% = 3%.

Important caveat: The IEEE 1789 percent flicker limit formula produces increasingly stringent (and arguably unachievable) limits at higher frequencies. For example, at 1 kHz, the "no observable effect" limit is 0.25% modulation—tighter than the typical noise floor of most commercial flicker measurement instruments. The standard acknowledges this and allows for an alternative "low risk" based on the absence of visible artefacts rather than percent flicker magnitude. Many manufacturers use the SVM metric (SVM < 0.4) as a more practical design target.

3.2 EU Ecodesign Regulation (EU) 2019/2020

Effective from September 2021, the EU Ecodesiver (EC) Regulation (EU) 2019/2020 (and its amendment CRM-005-2022, under development as of mid-2026) sets mandatory limits for flicker and stroboscopic effect in light sources placed on the EU market:

ParameterLimitEffective DateReference
SVM (stroboscopic effect)≤ 0.4September 2021Annex III, Part B, (g)
PstLM (flicker severity)≤ 1.0September 2021Annex III, Part B, (h)
Flicker frequency (≥ 50% modulation)No requirement at present*

* CRM-005-2022 proposes a new limit for modulation depth at frequencies 100–800 Hz based on weighted SVM equivalent; final adoption expected Q4 2026.

The PstLM metric is derived from the IEC 61000-4-15 flickermeter standard, adapted for lighting (LM: light modulation). It evaluates the short-term (10-minute) flicker severity on a scale where 1.0 corresponds to the threshold of perceptibility for 50% of observers. The measurement is based on demodulation of the 50 Hz or 60 Hz power-line frequency through a weighting filter that simulates the eye-brain visual system's sensitivity to voltage fluctuations → light output fluctuations. PstLM ≤ 1.0 is the EU Ecodesign mandatory limit.

4. Root Causes of TLA in LED Drivers

Unlike incandescent lamps (whose thermal inertia provides natural low-pass filtering of AC line modulation—typically 5–10% ripple at 100/120 Hz), LEDs respond to current modulation virtually instantaneously (nanosecond-scale rise time). The primary causes of TLA in LED lighting products include:

5. Measurement Methods and Instrumentation

MetricStandardSensor RequiredBandwidth / Sample RateKey Requirement
SVMIEC TR 63158:2018 / CIE TN 006:2016Photodiode + V(λ) filter≥ 20 kHz samplingLinear response to 2 kHz minimum
PstLMIEC 61000-4-15 + modification for lightingFlickermeter or equivalent digital0.5 Hz – 40 Hz (flicker weighting)Amplitude accuracy ±1%
Percent FlickerIES RP-16-17 / NEMA 77-2017Any calibrated photoreceptor≥ 2 kHz (NEMA 77)Max/Min/Avg over ≥ 1 sec
Flicker IndexIES RP-16-17Any calibrated photoreceptor≥ 2 kHzArea-based metric (0–1)
ASSIST Flicker PerceptionLRC ASSIST 2014Photodiode + DSO≥ 2 kHzFrequency-weighted perception metric
Practical guidance: For in-field TLA compliance verification, a portable spectrometer capable of 5 kHz+ sampling is recommended (e.g., GL Spectis 5.0 Touch with high-speed option, or Ocean Insight HR series coupled to a calibrated photodetector). For production testing, NEMA 77-compliant flicker analyzers are available from several manufacturers. For design validation, the CIE SVM Calculator (free spreadsheet available from the CIE website) can be used for waveform data analysis.

6. Design Strategies for TLA Mitigation

7. Standards and References

  1. CIE S 017/E:2020 ILV: International Lighting Vocabulary.
  2. CIE 249:2022: Visual Aspects of Time-Modulated Lighting Systems — Definitions and Measurement Methods.
  3. CIE TN 006:2016: Visual Aspects of Time-Modulated Lighting Systems — The Stroboscopic Effect Visibility Measure.
  4. IEC TR 63158:2018: Equipment for stroboscopic effect visibility measure (SVM) of lighting equipment.
  5. IEEE 1789-2015: IEEE Recommended Practices for Modulating Current in High-Brightness LEDs for Mitigating Health Risks to Viewers.
  6. EU Commission Regulation (EU) 2019/2020, Official Journal of the European Union, L 315/120.
  7. NEMA 77-2017: Standard for Temporal Light Artifacts (Flicker) in Lighting.
  8. IES RP-16-17: Nomenclature and Definitions for Illuminating Engineering (see sections on temporal light artefacts).
  9. Kelly, D.H. (1971). Theory of flicker and transient responses. Journal of the Optical Society of America, 61(4), 537–545.
  10. de Lange, H. (1958). Research into the dynamic nature of the human fovea → cortex systems with intermittent and modulated light. Journal of the Optical Society of America, 48(11), 777–784.
  11. Wilkins, A.J. et al. (2010). LED lighting flicker and potential health concerns: IEEE standard PAR1789 update. Proceedings of the IEEE Energy Conversion Congress and Exposition.

8. Related Articles

Sources: CIE S 017 · CIE 249:2022 · IEEE 1789-2015 · EU 2019/2020 · IEC TR 63158 · NEMA 77 · de Lange 1958 · Kelly 1971 · Wilkins 2010
Disclaimer: This article is for educational reference. Compliance verification should be performed by an accredited testing laboratory per applicable regulations.